Alexandria, Virginia – The United States Patent and Trademark Office (“USPTO”) will hold its next in a series of Patent Quality Chats on Tuesday, July 14th, with its second Chat on this month’s topic – Face-to-Face Examiner Interviews: A Demonstration of USPTO Tools hosted by Director of Technology Center 2400 Timothy Callahan. Mr. Callahan will be demonstrating USPTO tools for virtual, face-to-face interviews and discussing various initiatives for enhancing the quality of Examiner-Applicant interviews while collecting feedback and listening for new stakeholder ideas on the same.
The USPTO held its first Patent Quality Chat webinar in June; that month’s topic was Clarity of the Record, hosted by Deputy Commissioner for Patent Examination Policy Drew Hirshfeld. Deputy Commissioner Hirshfeld discussed various patent examiner training modules covering the topics of 35 U.S.C § 112, functional claiming, and making the record clear; he also reviewed the Clarity of the Record Quality Initiative. A video recording of this 1-hour inaugural event can be found here and is also linked on the USPTO’s Patent Quality Chat webpage where the slide presentation from the June 9th event can also be found.
Regularly scheduled on the second Tuesday of each month, these Patent Quality Chats are a lunchtime webinar series designed to provide information on various patent quality topics and to continue the dialogue between the USPTO and its stakeholders about enhancing patent quality.
Patent Quality Chat webinar series for 2015
Completed: June 9: Clarity of the Record – available for reviewing on our Web page
NEXT: July 14: Face-to-Face Examiner Interviews: A Demonstration of USPTO Tools
Upcoming: August 11: Measuring Patent Quality
Future webinar dates of Sept. 8, Oct. 13, and Nov. 10 are scheduled and may include topics such as Office of Patent Quality Review (OPQA) Processes, Compact Prosecution, and Special Programs for Patent Prosecution.
All events are exclusively via webinar from Noon – 1 p.m. on the second Tuesday of the month. For more information, see here.